Thesis:
Analysis of Closed-Loop Digital Twin
Articles:
Analysis of a closed-loop digital twin using discrete event simulation
Eyring, A., Hoyt, N., Tenny, J., Domike, R., & Hovanski, Y. (2022). The International Journal of Advanced Manufacturing Technology, volume 123, issue 1-2, starting on page 245. https://doi.org/10.1007/s00170-022-10176-5